atomic force microscopy [FBbi_00000259]

the scanning probe is maintained at a fixed distance above the surface e of the specimen by van der Waals forces
Tags:

Open atomic force microscopy in VFB

VFB Term Json

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        },
        "description": [
            "the scanning probe is maintained at a fixed distance above the surface e of the specimen by van der Waals forces"
        ],
        "comment": []
    },
    "query": "Get JSON for Class",
    "version": "44725ae",
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            "types": [
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                "Class"
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            "short_form": "FBbi_00000344",
            "label": "scanning probe microscopy"
        }
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    "anatomy_channel_image": [],
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