focussed ion beam scanning electron microscopy (FIB-SEM) [FBbi_00050000]
A method of reconstructing 3D structure by combining focussed ion beam milling to remove sucessive layers from a sample block with scanning EM to image the exposed surface between each milling step.
Note
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VFB Term Json
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"A method of reconstructing 3D structure by combining focussed ion beam milling to remove sucessive layers from a sample block with scanning EM to image the exposed surface between each milling step."
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"version": "44725ae",
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