secondary_electron imaging [FBbi_00000372]
image created using the electrons generated by ionization of a sample due to inelastic scattering of the primary beam of radiation
Note
This page displays the raw VFB json record for this term. Please use the link below to open the term inside the Virtual Fly Brain viewerOpen secondary_electron imaging in VFB
VFB Term Json
{
"term": {
"core": {
"iri": "http://purl.obolibrary.org/obo/FBbi_00000372",
"symbol": "",
"types": [
"Entity",
"Class"
],
"short_form": "FBbi_00000372",
"label": "secondary_electron imaging"
},
"description": [
"image created using the electrons generated by ionization of a sample due to inelastic scattering of the primary beam of radiation"
],
"comment": []
},
"query": "Get JSON for Class",
"version": "44725ae",
"parents": [
{
"symbol": "SEM",
"iri": "http://purl.obolibrary.org/obo/FBbi_00000257",
"types": [
"Entity",
"Class"
],
"short_form": "FBbi_00000257",
"label": "scanning electron microscopy (SEM)"
}
],
"relationships": [],
"xrefs": [],
"anatomy_channel_image": [],
"pub_syn": [],
"def_pubs": [
{
"core": {
"symbol": "",
"iri": "http://flybase.org/reports/Unattributed",
"types": [
"Entity",
"Individual",
"pub"
],
"short_form": "Unattributed",
"label": ""
},
"FlyBase": "",
"PubMed": "",
"DOI": ""
}
]
}
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