FIB-SEM FBbi_00050000
FIB-SEM
ID: FBbi_00050000
Class
A method of reconstructing 3D structure by combining focussed ion beam milling to remove sucessive layers from a sample block with scanning EM to image the exposed surface between each milling step.
Open in VFB 3D Browser →Classification
Alternative Names
| Synonym | Scope | Reference |
|---|---|---|
| FIB-SEM | exact synonym |